- Learn the purpose and significance of measurement and inspection in semiconductor fabrication, focusing on material and device analysis.
- Explore key metrology concepts like critical dimensions, surface roughness, and film thickness.
- Use interactive virtual tools to simulate the operation of Scanning Electron Microscopes (SEM), Atomic Force Microscopes (AFM), and profilometers.
- Practice adjusting instrument parameters and settings to achieve accurate and reliable measurements.
- Conduct virtual measurements to determine film thickness, surface roughness, and critical dimensions of semiconductor devices.
- Interpret data to assess material characteristics, performance, and compliance with manufacturing specifications.